
JQA-QM5039
Kawaguchi
Factory
JQA-EM4098
Kawaguchi
Factory

- digital microscope

- Scanning Electron Microscope

- Inductively Coupled Plasma-AES

- measuring instrument which measures hardness of the metal plating

- X-ray fluorescence analysis to measure thickness of the metal plating

- X-ray fluorescence analysis to measure thickness of the metal plating

